Background Rejection in Two-Photon Fluorescence Image Scanning Microscopy
نویسندگان
چکیده
We discuss the properties of signal strength and integrated intensity in two-photon excitation confocal microscopy image scanning microscopy. The resolution, optical sectioning background rejection are all improved over nonconfocal Replacing pinhole with a detector array increases peak point spread function. outer pixels give signals from defocused regions, thus processing these, such as through subtraction, can further improve rejection.
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ژورنال
عنوان ژورنال: Photonics
سال: 2023
ISSN: ['2304-6732']
DOI: https://doi.org/10.3390/photonics10050601